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Updated: Jun 18, 2025

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
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无轴承惯性旋转阶段用于原子力显微镜

Eva Osuna1,2, Aitor Zambudio1,2, Pablo Ares1,2

  • 1Departamento de Física de la Materia Condensada, Universidad Autónoma de Madrid, 28049 Madrid, Spain.

Micromachines
|July 27, 2024
PubMed
概括

一个新的惯性运动旋转阶段为原子力显微镜 (AFM) 提供轻量化,紧的设计. 它提供高角度精度和可靠的性能,对于扫描探头显微镜有效.

关键词:
航空飞行管理 (AFM)纳米技术是纳米技术.压电惯性运动是一种压电惯性运动.定位定位 定位定位旋转阶段的旋转阶段

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相关概念视频

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
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