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Updated: Aug 18, 2026

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments
11:47

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

Published on: February 27, 2013

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二维超声波辅助化碳的多步两维超声波辅助研磨:关于表面地形和粗性的实验研究

Hongbo Li1, Tao Chen2, Wenbo Bie3

  • 1School of Intelligent Manufacturing and Electrical Engineering, Nanyang Normal University, Nanyang 473061, China.

Micromachines
|July 27, 2024
PubMed
概括

这项研究揭示了超声波振幅如何影响二维超声波辅助研磨 (2D-UAG) 期间的碳化表面质量. 最佳的振幅降低了粗度,而更高的振幅可以增加它,提供加工参数洞察力.

关键词:
碳化是碳化的重要组成部分.表面损伤 表面损伤表面微观形态的表面微观形态表面的粗度 表面的粗度超声波辅助的二维研磨方法

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The Evolution of Silica Nanoparticle-polyester Coatings on Surfaces Exposed to Sunlight

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Roughness Impact of Piezoelectric Dental Scaler on Two Distinct Flowable Composite Filling Materials05:30

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相关概念视频

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...