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Super-resolution Fluorescence Microscopy

Super-resolution Fluorescence Microscopy

Super-resolution fluorescence microscopy (SRFM) provides a better resolution than conventional fluorescence microscopy by reducing the point spread function (PSF). PSF is the light intensity distribution from a point that causes it to appear blurred. Due to PSF, each fluorescing point appears bigger than its actual size, and it is the PSF interference of nearby fluorophores that causes the blurred image. Various approaches to achieving higher resolution through SRFM have recently been...

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Updated: Jun 18, 2025

Spectral and Angle-Resolved Magneto-Optical Characterization of Photonic Nanostructures

Spectral and Angle-Resolved Magneto-Optical Characterization of Photonic Nanostructures

Published on: November 21, 2019

扫描等离子增强显微镜用于同时进行光电特性鉴定.

Joanna Symonowicz¹, Atif Jan¹, Han Yan¹

¹Department of Materials Science and Metallurgy, University of Cambridge, 27 Charles Babbage Road, Cambridge CB3 0FS, United Kingdom.

|July 27, 2024

概括

我们开发了用于纳米电子的扫描等离子体增强显微镜 (SPEM). 这种技术同时提供了像MoS2这样的二维材料的光学和电气表征,克服了当前方法的局限性.

科学领域:

纳米技术纳米技术
材料科学材料科学材料科学
表面科学是一门学科.

背景情况:

扫描显微镜对于纳米电子学至关重要,但由于探头的脆弱性和操作能力有限,它面临着挑战.
目前的技术往往无法同时进行光学和电气表征.

研究的目的:

介绍扫描等离子体增强显微镜 (SPEM) 作为一种用于纳米电子表征的新技术.
展示SPEM在MoS2和WSe2纳米板等过渡金属二基化物 (TMD) 上的能力.

主要方法:

SPEM使用纳米颗粒在镜面 (NPoM) 配置与便携式导电杆.
实现高光学分辨率 (600nm) 与显著的光学信号增强 (高达20,000x).
采用15纳米金纳米粒子,用于原始,无损的范德瓦尔斯接触.

主要成果:

通过SPEM,可以同时进行光学和电气表征,这是相对于现有方法的关键优势.
由于原始接触,在纳米尺度上观察到MoS2中的意想不到的p型行为.
取得了优异的纳米尺度绘图分辨率,重建了NPoM分析而不需要大量的统计数据.

结论:

关键词:

电气和光学表征的电气和光学特性.在操作中.纳米电极是一种纳米电极.塑制剂的使用方法扫描显微镜扫描显微镜同时进行表征.

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Determination of the Excitation and Coupling Rates Between Light Emitters and Surface Plasmon Polaritons

Determination of the Excitation and Coupling Rates Between Light Emitters and Surface Plasmon Polaritons

Published on: July 21, 2018

Measurement of Scattering Nonlinearities from a Single Plasmonic Nanoparticle

Measurement of Scattering Nonlinearities from a Single Plasmonic Nanoparticle

Published on: January 3, 2016

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Last Updated: Jun 18, 2025

Spectral and Angle-Resolved Magneto-Optical Characterization of Photonic Nanostructures

Spectral and Angle-Resolved Magneto-Optical Characterization of Photonic Nanostructures

Published on: November 21, 2019

Determination of the Excitation and Coupling Rates Between Light Emitters and Surface Plasmon Polaritons

Determination of the Excitation and Coupling Rates Between Light Emitters and Surface Plasmon Polaritons

Published on: July 21, 2018

Measurement of Scattering Nonlinearities from a Single Plasmonic Nanoparticle

Measurement of Scattering Nonlinearities from a Single Plasmonic Nanoparticle

Published on: January 3, 2016

对于纳米电子,SPEM提供了卓越的光学和电气特性,简单性,耐用性和可重复性.

它超越了其他扫描技术,使其成为推动纳米电子研究的最佳工具.

SPEM 方便对二维材料进行详细的纳米级分析.