剪贴镜头用于扫描道发光显微镜的光显微镜
Aleš Cahlík1, Cinja C Müller1, Fabian D Natterer1
1Department of Physics, University of Zurich, Winterthurerstrasse 190, CH-8057 Zurich, Switzerland.
MethodsX
|August 6, 2024
概括
研究人员开发了一种用于扫描道显微镜的简单的剪贴镜头,使电光发光实验成为可能. 这种修改有效地从等离子结处收集光,将现有的设置转化为实际的发光显微镜.
科学领域:
- 材料科学 材料科学 材料科学
- 纳米技术纳米技术
- 光学是什么?光学是什么?光学是什么?
背景情况:
- 扫描道显微镜 (STM) 是纳米级成像和光谱学的强大工具.
- 电发光 (EL) 实验需要有效的光收集来进行详细分析.
- 将光学元件集成到现有的STM设置中可能具有挑战性.
研究的目的:
- 证明和验证现有扫描道显微镜在现场添加用于电光发光实验的采集透镜.
- 开发一种简单,可逆的方法来增强STM中的光收集.
- 为了将标准的STM设置转换为实际的扫描发光显微镜.
主要方法:
- 剪贴式收集镜头的制造与标准样品传输工具兼容.
- 在STM环境中,可逆地将镜头连接到样品板上.
- 使用修改后的STM设置,在plasmonic道连接点的现场光学表征.
主要成果:
- 从等离子体道连接点发出的光成功地与光学视窗相结合.
- 由于镜头靠近道结合点,实现了良好的采光效率.
- 通过测量来自Au和Ag的偏差依赖等离子体辐射,并获得空间发光图来验证剪贴镜头的功能.
结论:
- 剪贴镜头提供了一种快速有效的方法来升级现有的STM用于发光研究.
- 这种方法有助于将标准的STM转换为多功能扫描发光显微镜.
- 展示的技术可以在现场进行高收集效率的光学测量.
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