对具有强纹理的小粒度多晶体进行X射线张量断层扫描
Mads Carlsen1, Christian Appel1, William Hearn1
1Photon Science Division Paul Scherrer Institut 5232Villigen PSI Switzerland.
概括
小角X射线张量断层扫描可以重建样本散射密度. 本研究评估了用于更快的方向变化的算法,并将其测试在钢丝上,以评估复杂纹理的性能.
科学领域:
- 材料科学 材料科学 材料科学
- 物理 物理学 物理
- 晶体学 晶体学是指结晶学.
背景情况:
- 小角X射线张量断层扫描可以重建异型散射密度.
- 目前的方法通常使用球体波器模拟缓慢的方向变化 (纹理),直至顺序l = 8.
- 散射密度的更快变化对现有的算法构成了挑战.
研究的目的:
- 调查已建立的小角度X射线张量断层扫描算法在散射密度有快速方向变化的样品上的性能.
- 为了比较这些算法的预期和实现的性能.
- 为了确定张量断层扫描对具有复杂纹理的样品的可行性.
主要方法:
- 测试已建立的小角度X射线张量断层扫描算法.
- 使用广角X射线散射数据从已知纹理的钢丝.
- 基于重建的异型散射密度的真实性来分析性能.
主要成果:
- 证明了张量断层算法处理散射密度更快变化的能力.
- 提供了对不同已建立算法的性能进行比较分析.
- 对具有复杂晶体结构的材料验证了张量断层扫描方法.
结论:
- 已建立的算法显示出分析具有复杂方向散射特性的材料的前景.
- 这项研究验证了张量断层扫描方法用于详细的微观结构特征.
- 进一步的研究可以改进算法,以提高复杂纹理分析的准确性.
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