用于在77 ns爆率成像仪中使用的收集电子的CdTe的特征.
Lena A Franklin1, Nicholas J Brown1, Sol M Gruner1
1Physics Department, Cornell University, Ithaca, NY, USA.
Journal of synchrotron radiation
|August 7, 2024
概括
凯克-PAD探测器被升级为更快的成像在先进的光子源. 新的收集电子的 Telluride 传感器实现了快速电荷收集,满足了新的速度要求.
科学领域:
- 在X射线探测器技术技术上,
- 材料科学用于高能物理物理.
背景情况:
- 基克-PAD (像素阵列探测器) 设计用于先进光子源 (APS) 的高速X射线成像.
- 即将到来的APS升级将将电子束之间的时间缩短到77 ns,需要更快的探测器电子和传感器材料.
研究的目的:
- 修改Keck-PAD电子系统并评估用于高能X射线成像的新传感器材料,以减少77 ns的束周期.
- 为了确保使用电子采集CdTe.使用40 keVX射线在35 ns内采集90%以上的电荷.
主要方法:
- 将750微米厚的采集电子的肖特基 telluride (CdTe) 粘合到Keck-PAD和CU-APS-PAD应用特定的集成电路 (ASIC).
- 通过检测器对康奈尔高能同步子源和脉冲光学激光器单个X射线束的响应来研究载体的移动性.
- 模拟40keV电子采集CdTe的电荷采集时间.
主要成果:
- 收集电子的CdTe在模拟中显示在35 ns内收集了90%以上的电荷,满足77 ns的成像要求.
- 实验测试证实,收集电子的CdTe的载体移动性满足高速成像所需的收集时间.
- 已经成功地将CdTe与康奈尔大学开发的ASIC结合起来.
结论:
- 开发的收集电子的CdTe传感器适用于升级的APS的高速X射线成像.
- 基克-PAD探测器系统,随着修改和新的传感器,可以实现所需的77 ns成像率.
- 这一进步使得高能X射线实验中的数据采集更加有效.
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