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Updated: Jun 17, 2025

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图像化和量化电荷状态依赖的Young的模块LiMn2O4纳米化颗粒由双模 AFM 的双模 AFM

Pengtao Lou1, Zhuanfang Bi1, Xinru Wang1

  • 1School of Physics, Beihang University, Beijing 100191, People's Republic of China.

Langmuir : the ACS journal of surfaces and colloids
|August 8, 2024
PubMed
概括

离子电池的机械损坏可以通过了解氧化如何减少.

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相关概念视频

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
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