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Updated: Jun 17, 2025

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments
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Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

Published on: February 27, 2013

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形态独立的通用光学表面拖拉器光束

Neng Wang1, Jack Ng2, Guo Ping Wang3,4

  • 1State Key Laboratory of Radio Frequency Heterogeneous Integration, Shenzhen University, Shenzhen, China.

Nature communications
|August 9, 2024
PubMed
概括

研究人员开发了一种新的光学表面引力束. 该设备使用表面波来拉动任何被动粒子,克服了传统光学引力束的局限性.

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High-speed Particle Image Velocimetry Near Surfaces11:59

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相关概念视频

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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