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Updated: May 14, 2026

Selective Area Modification of Silicon Surface Wettability by Pulsed UV Laser Irradiation in Liquid Environment
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Published on: November 9, 2015

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纳米秒激光火加工的表面结构超化,用于高效的近红外探测

Li Cheng1, Xiang Lv1, Degong Ding1

  • 1State Key Laboratory of Silicon and Advanced Semiconductor Materials, School of Materials Science & Engineering, Zhejiang University, Hangzhou, Zhejiang 310027, People's Republic of China.

Nanotechnology
|August 13, 2024
PubMed
概括

纳米秒激光化 (NLA) 通过改善晶体结构和减少电荷载体重组来增强超化 (Si:Ti) 用于近红外检测. 这导致Si:Ti光探测器在1550nm处具有高响应性.

关键词:
过度化的.红外光电探测器 红外光电探测器纳米秒激光火处理表面结构工程 表面结构工程

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Super-resolution Fluorescence Microscopy01:37

Super-resolution Fluorescence Microscopy

Super-resolution fluorescence microscopy (SRFM) provides a better resolution than conventional fluorescence microscopy by reducing the point spread function (PSF). PSF is the light intensity distribution from a point that causes it to appear blurred. Due to PSF, each fluorescing point appears bigger than its actual size, and it is the PSF interference of nearby fluorophores that causes the blurred image. Various approaches to achieving higher resolution through SRFM have recently been developed.