Jove
Visualize
联系我们
JoVE
x logofacebook logolinkedin logoyoutube logo
关于 JoVE
概览领导团队博客JoVE 帮助中心
作者
出版流程编辑委员会范围与政策同行评审常见问题投稿
图书馆员
用户评价订阅访问资源图书馆顾问委员会常见问题
研究
JoVE JournalMethods CollectionsJoVE Encyclopedia of Experiments存档
教育
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab Manual教师资源中心教师网站
使用条款与条件
隐私政策
政策

相关概念视频

Metal-Semiconductor Junctions01:24

Metal-Semiconductor Junctions

319
The contact of metal and semiconductor can lead to the formation of a junction with either Schottky or Ohmic behavior.
Schottky Barriers
Schottky barriers arise when a metal with a work function (Φm) contacts a semiconductor with a different work function (Φs). Initially, electrons transfer until the Fermi levels of the metal and semiconductor align at equilibrium. For instance, if Φm > Φs, the semiconductor Fermi level is higher than the metal's before contact. The...
319
Biasing of FET01:22

Biasing of FET

239
Biasing a Junction Field Effect Transistor (JFET) is crucial for setting operational parameters and ensuring efficient functioning in electronic circuits. JFETs are characterized by using a single carrier type in N-channel or P-channel configurations, where the channel is surrounded by PN junctions. These junctions are central to the device's ability to control current flow.
In an N-channel JFET, the structure consists of N-type material forming the channel on a P-type substrate, with the...
239
Biasing of Metal-Semiconductor Junctions01:27

Biasing of Metal-Semiconductor Junctions

232
Biasing metal-semiconductor junctions involves applying a voltage across the junction. Specifically, the metal is connected to a voltage source, while the semiconductor is grounded. This technique is essential for controlling the direction and magnitude of current flow in electronic devices, including diodes, transistors, and photovoltaic cells.
In Schottky junctions, where the semiconductor is n-type, applying a positive voltage to the metal relative to the semiconductor reduces its Fermi...
232
P-N junction01:11

P-N junction

499
A p-n junction is formed when p-type and n-type semiconductor materials are joined together. At the interface of the p-n junction, holes from the p-side and electrons from the n-side begin to diffuse into the opposite sides due to the concentration gradient. This diffusion of carriers leads to a region around the junction where there are no free charge carriers, known as the depletion region. The charge density within the depletion region for the n-side and p-side can be described by the...
499
Tight Junctions01:29

Tight Junctions

5.2K
Tight junctions are molecular seals between cells that prevent the leaking of fluids, ions, and other small solutes across cavities and compartments in multicellular organisms. They are mainly composed of claudin and occludin transmembrane proteins, and other proteins such as tricellulin and JAM (junctional adhesion molecule). All these proteins are 4-pass transmembrane proteins, except JAM, which is a single-pass transmembrane protein belonging to the immunoglobulin superfamily. The...
5.2K
Carrier Transport01:21

Carrier Transport

418
The generation of electrical current in semiconductors is fundamentally driven by two mechanisms: drift and diffusion. These processes are essential for the functionality and performance of semiconductor-based devices.
Drift Current:
The drift of charge carriers is started by an external electric field (E). Charged particles, such as electrons and holes, experience an acceleration between collisions with lattice atoms. For electrons, this results in a drift velocity (vd) given by:
418

您也可能阅读

相关文章

通过共同作者、期刊和引用图与本文相关的文章。

排序
Same author

Modified Hotz Operation Combined with Modified Medial Canthoplasty to Correct Congenital Lower Eyelid Epiblepharon in a Chinese Population.

Aesthetic plastic surgery·2026
Same author

ISGylation-mediated stabilization of CYP4Z1 fuels breast cancer initiation and progression.

Experimental & molecular medicine·2026
Same author

Efficacy of an Integrated Nursing Protocol for the Management of Postoperative Upper Limb Circulatory Complications Following Transradial Coronary Intervention.

Clinical and applied thrombosis/hemostasis : official journal of the International Academy of Clinical and Applied Thrombosis/Hemostasis·2026
Same author

Antler stem cells effectively alleviate the symptoms of cerebral ischemic injury via immunomodulation of the spleen.

Cell death discovery·2026
Same author

Spontaneous pregnancy in a woman with diminished ovarian reserve following dietary supplementation with major royal jelly proteins: A case report.

Medicine·2026
Same author

Genomic Research for Abdominal Pain in Patients with Irritable Bowel Syndrome or Inflammatory Bowel Disease Before and After Mind-Body Intervention.

Journal of pain research·2026

相关实验视频

Updated: Jun 16, 2025

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

9.6K

在分子道结处动态阻断泄漏电流.

Yu Xie1, Shengzhe Qiu1, Qianqian Guo2

  • 1Key Laboratory of Organic Optoelectronics and Molecular Engineering, Department of Chemistry, Tsinghua University Beijing 100084 P. R. China yuanli_thu@tsinghua.edu.cn.

Chemical science
|August 16, 2024
PubMed
概括
此摘要是机器生成的。

研究人员开发了带有混合骨干的分子二极管,以动态阻断泄漏电流. 这项创新显著提高了整形比率,克服了用于实际电子应用的传统分子连接的局限性.

更多相关视频

Silicon Metal-oxide-semiconductor Quantum Dots for Single-electron Pumping
14:58

Silicon Metal-oxide-semiconductor Quantum Dots for Single-electron Pumping

Published on: June 3, 2015

14.6K
Scalable Quantum Integrated Circuits on Superconducting Two-Dimensional Electron Gas Platform
05:39

Scalable Quantum Integrated Circuits on Superconducting Two-Dimensional Electron Gas Platform

Published on: August 2, 2019

9.6K

相关实验视频

Last Updated: Jun 16, 2025

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

9.6K
Silicon Metal-oxide-semiconductor Quantum Dots for Single-electron Pumping
14:58

Silicon Metal-oxide-semiconductor Quantum Dots for Single-electron Pumping

Published on: June 3, 2015

14.6K
Scalable Quantum Integrated Circuits on Superconducting Two-Dimensional Electron Gas Platform
05:39

Scalable Quantum Integrated Circuits on Superconducting Two-Dimensional Electron Gas Platform

Published on: August 2, 2019

9.6K

科学领域:

  • 分子电子学分子电子学
  • 纳米技术 纳米技术
  • 材料科学是一种材料科学.

背景情况:

  • 使用自组装单层 (SAM) 的分子道连接显示了纳米级校正.
  • 在SAM的缺陷导致高泄漏电流,限制分子二极管的性能.
  • 与或薄膜设备相比,当前的分子二极管的性能不佳.

研究的目的:

  • 通过动态阻断道电流来提高分子二极管的性能.
  • 通过创新的结构设计,克服分子连接处的泄漏问题.
  • 为了证明分子动态行为的可行性,用于实际的电子.

主要方法:

  • 将具有弹性-刚性结构的"混合脊柱"纳入分子结点.
  • 利用界面二极子时刻和电场之间的相互作用来触发SAM中的结构化包装.
  • 通过电化学和电光发光来验证超分子结构的重新排列.

主要成果:

  • 实现了道电流的动态阻断,这在非分子技术上是困难的.
  • 泄漏电流被有效地阻断了超过一个数量级.
  • 修正比率显著提高.
  • 在曲和粗电极等具有挑战性的环境中表现出强性.

结论:

  • 分子连接处的混合骨干结构使动态电流阻断成为可能.
  • 实现了更高的整形比率和更好的设备性能.
  • 分子的动态行为显示出实际电子应用的前景.