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对于大尺寸金属材料的火花映射分析的光谱强度漂移校正
Xiaofen Zhang1, Yunhai Jia2, Zhigang Yang2
1Beijing Advanced Innovation center for materials genome engineering, Central Iron and Steel Research Institute, Beijing, 100081, China; School of Metallurgical and Ecological Engineering, University of Science and Technology Beijing, Beijing, 100083, China.
Analytica chimica acta
|August 25, 2024
概括
一种新方法纠正了用Spark Mapping Analysis for Large Samples (SMALS) 分析的大型金属样本中的光谱强度漂移. 这提高了元素内容特征的准确性,特别是在长时间扫描中.
科学领域:
- 分析化学 分析化学
- 材料科学 材料科学 材料科学
- 频谱学是一种光谱学.
背景情况:
- 光谱强度漂移是大型金属材料长期元素分析的一个常见问题.
- 这种偏移会对分析结果的准确性和稳定性产生重大影响.
- 现有的方法无法解决长时间激发过程中的漂移问题.
研究的目的:
- 开发和验证用于大样本的强度漂移校正方法,使用大样本的火花映射分析 (SMALS) 技术.
- 提高对元素组成的光谱分析的准确性和稳定性.
- 为了应对长期激发扫描中光谱强度漂移的挑战.
主要方法:
- 提出了一种针对SMALS数据量身定制的新型强度偏移校正方法.
- 实现了对行内和列内数据的曲线拟合基线校正.
- 使用了对行间和列间数据的总平均值调整.
- 结合的行和列数据用于最终的测量值.
主要成果:
- 该方法有效地减少了测量和漂移错误,增强了基线校正.
- 钢横截面和纵截面的表征显示与微光束X射线光 (μ-XRF) 结果有很高的一致性.
- 经过校正的数据显示了强烈的对齐,并提高了元素分离模式的清晰度.
结论:
- 开发的方法提高了光谱质量,提高了定量和定性分析的准确性和稳定性.
- 使用SMALS.建立了一个坚实的基础,用于大尺寸金属材料的组件表征.
- 这种新的校正方法对于大规模的长时间光谱分析具有重要的理论和实践价值.
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