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Updated: May 3, 2026

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在各种条件下研究增强的GaN HEMT设备的单一事件效应
Xinxiang Zhang1,2, Yanrong Cao1,2, Chuan Chen1,2
1School of Electronics & Mechanical Engineering, Xidian University, Xi'an 710071, China.
Micromachines
|August 29, 2024
概括
化 (GaN) 高电子流动性晶体管 (HEMT) 设备易受重离子辐射的影响. 预先应用的电应力和更高的线性能量转移 (LET) 值会使GaN设备中的单一事件效应 (SEE) 恶化.
科学领域:
- 材料科学 材料科学 材料科学
- 半导体物理 半导体物理
- 可靠性工程可靠性工程
背景情况:
- 高电子移动性晶体管 (HEMT) 对太空设备至关重要.
- 这些设备对重离子辐射的单次事件效应 (SEE) 具有敏感性,影响运行安全.
研究的目的:
- 为了研究预先应用的电应力,变化的线性能量传输 (LET) 值和门电压对Cascode GaN电源设备中的SEE的影响.
- 阐明导致观测到的SEE的潜在损害机制.
主要方法:
- 使用 (Ge) 离子 (LET = 37 MeV·cm2/mg) 和 (Bi) 离子 (LET = 98 MeV·cm2/mg) 辐射Cascode GaN功率设备.
- 在预先施加的电应力条件下分析SEE,不同的LET值和不同的网关电压.
主要成果:
- 预先施加的电应力诱导电子脱落和缺陷生成,增强电荷收集并增加排水泄漏电流.
- 较高的LET值导致电离度增加,电荷收集量增加,燃烧电压更高.
- 关闭状态下的负门电压加剧了后通道效应,特别是在更高的排水电压下.
结论:
- 这项研究为了解在辐射密集型环境中GaN功率装置可靠性的理论基础.
- 这些发现突出了电压和辐射LET在确定设备对SEE敏感性的关键作用.
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