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关于航空航天级静态RAM基于现场可编程门数组软错误纠正技术的审查

Weihang Wang¹, Xuewu Li¹, Lei Chen²

¹Beijing Microelectronics Technology Institute, Beijing 100076, China.

Sensors (Basel, Switzerland)

|August 29, 2024

概括

本研究通过分析灵敏度来提高维修效率来解决航空航天FPGA中的软错误. 有针对性的软错误检测和纠正提高了基于太空的FPGA的可靠性.

科学领域:

航空航天工程航空航天工程
计算机架构计算机架构
可靠性工程可靠性工程

背景情况:

基于航空航天级SRAM的FPGA易受单次事件影响的影响,导致软错误.
越来越复杂的FPGA加剧了纠正这些软错误的挑战.

研究的目的:

建议对FPGAs进行软错误灵敏度分析,以提高软错误修复效率.
审查分析FPGA资源和配置位流中的软错误敏感性的方法.

主要方法:

对FPGA应用层资源的软错误灵敏度分析方法进行审查.
对FPGA配置位流的软错误灵敏度分析方法进行审查.
讨论应用层内存清洗和配置清洗技术.

主要成果:

灵敏度分析可以识别FPGAs中易受软错误的关键区域.
基于灵敏度分析的有针对性的擦洗技术提高了纠错效率.
新兴技术为强大的FPGA可靠性提供了未来的方向.

结论:

软误差灵敏度分析对于在FPGA中有效的软误差缓解至关重要.
实施有针对性的检测和纠正策略可以提高航空航天FPGA的可靠性.
对新型减缓技术的持续研究对于未来的太空应用至关重要.

关键词:

基于SRAM的FPGA是一个FPGA.配置清洗洗净化配置清洗洗净化记忆清理擦拭记忆清理灵敏度分析是一种灵敏度分析.

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