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Updated: Jun 14, 2025

Exfoliation and Analysis of Large-area, Air-Sensitive Two-Dimensional Materials
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Exfoliation and Analysis of Large-area, Air-Sensitive Two-Dimensional Materials

Published on: January 5, 2019

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高通量机械剥皮范德瓦尔斯材料的X射线光电子光谱

Nuria Jiménez-Arévalo1, Carlo Mariani1,2, Fabrice Leardini3

  • 1Dipartimento di Fisica, Università di Roma "La Sapienza", 00185, Rome, Italy. nuria.jimenezarevalo@uniroma1.it.

Nanoscale
|September 3, 2024
PubMed
概括

高通量机械剥皮使得使用X射线光电子谱学 (XPS) 的范德瓦尔斯 (vdW) 材料的定量元素分析成为可能. 这种方法克服了小片大小带来的挑战,允许准确的材料表征.

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相关概念视频

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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