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Updated: Jun 13, 2025

In Situ SIMS and IR Spectroscopy of Well-defined Surfaces Prepared by Soft Landing of Mass-selected Ions
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Published on: June 16, 2014

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和离子诱导的电子和离子信号用于扫描离子显微镜应用

Yang Li1, Sheng Xu1,2, Thomas H Loeber3

  • 1Department of Applied Physics and Science Education, Eindhoven University of Technology (TU/e), P.O. Box 513, Eindhoven 5600 MB, The Netherlands.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|September 10, 2024
PubMed
概括

使用超冷卢比 (Rb+) 和 (Cs+) 原子的新型聚焦离子束 (FIB) 系统显示,与 (Ga+) FIB系统相比,二次电子成像的信号噪声比率更高.

关键词:
性金属离子 性金属离子聚焦的离子束.扫描离子显微镜扫描离子显微镜

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