相关实验视频

Updated: Jun 13, 2025

Covalent Attachment of Single Molecules for AFM-based Force Spectroscopy

Covalent Attachment of Single Molecules for AFM-based Force Spectroscopy

Published on: March 16, 2020

导电原子力显微镜中的相对湿度的影响

Yue Yuan¹, Mario Lanza^1,2

¹Materials Science and Engineering Program, Physical Science and Engineering Division, King Abdullah University of Science and Technology (KAUST), Thuwal, 23955, Saudi Arabia.

Advanced materials (Deerfield Beach, Fla.)

|September 11, 2024

概括

相对湿度 (RH) 显著影响导电原子力显微镜 (CAFM),由于水半径形成,绝缘体和半导体中的电流增加. 金属样本不受RH的影响,澄清了CAFM数据解释.

科学领域:

材料科学材料科学材料科学
表面科学是一门学科.
纳米技术纳米技术

背景情况:

导电原子力显微镜 (CAFM) 对于纳米电子分析至关重要.
现有的CAFM研究往往因不清楚相对湿度 (RH) 影响和有限的测试而矛盾.
以前的研究缺乏当前的局限性,冒着尖端损坏和数据不准确的风险.

研究的目的:

系统地调查相对湿度 (RH) 对CAFM测量的影响.
通过实施当前的限制,建立可靠的CAFM协议.
为了澄清各种材料中依赖于RH的电子现象.

主要方法:

在七个RH条件下,在十个不同的样本 (绝缘,半导体,导体) 上进行了超过17000次CAFM测试.
使用了具有110-pA电流限制的超可靠设置,以确保尖端完整性.
应用了升级电压应力来分析电气性质.

主要成果:

较高的RH增加了绝缘体和超薄半导体中的CAFM电流,这是由于导电水的缺陷.
这种RH效应在较厚的半导体中被掩盖,这是由于电子平均自由路径较长的原因.
金属样本没有表现出RH依赖性,证实了阴囊机制.

结论:

相对湿度显著影响CAFM的测量,主要是通过在尖端样本结处形成水半径.
实施当前的局限性保护CAFM尖端完整性,以便可靠,大量的数据收集.
这项研究为提高CAFM研究的准确性和可重复性提供了关键的见解.

关键词:

两维材料是二维材料.导电性原子力显微镜导电性原子力显微镜计量学计量学计量学计量学纳米电子学纳米电子学相对湿度相对湿度相对湿度

更多相关视频

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

Experimental Multiscale Methodology for Predicting Material Fouling Resistance

Experimental Multiscale Methodology for Predicting Material Fouling Resistance

相关概念视频

Preparation of Samples for Electron Microscopy

Preparation of Samples for Electron Microscopy

To be visualized by an electron microscope, either transmission or scanning, biological samples need to be fixed (stabilized) so the electron beam does not destroy them and dried thoroughly (desiccated/dehydrated) so the vacuum does not affect them. Fixation needs to be done as quickly as possible because the sample properties will start changing as soon as it is removed from its natural environment. For example, in a tissue sample, the oxygen levels begin decreasing, causing an altered...

Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...