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Updated: Jun 13, 2025

In Depth Analyses of LEDs by a Combination of X-ray Computed Tomography CT and Light Microscopy LM Correlated with Scanning Electron Microscopy SEM
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In Depth Analyses of LEDs by a Combination of X-ray Computed Tomography CT and Light Microscopy LM Correlated with Scanning Electron Microscopy SEM

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使用光谱光子计数CT评估金属存在的材料识别和量化

Briya Tariq1, Osama Sikander2, Nadine Francis1

  • 1Department of Physics, Khalifa University, Abu Dhabi, United Arab Emirates.

PloS one
|September 13, 2024
PubMed
概括

光谱光子计数计算机断层扫描 (SPCCT) 有效地减少金属工件,提高图像质量和材料识别精度. 这种先进的CT技术显示出涉及金属植入物的临床应用的巨大潜力.

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相关概念视频

Atomic Emission Spectroscopy: Overview01:20

Atomic Emission Spectroscopy: Overview

Atomic emission spectroscopy (AES) is an analytical technique used to determine the elemental composition of a sample by analyzing the light emitted from excited atoms. In AES, atoms in a sample are excited to higher energy levels by thermal energy from high-temperature sources, such as plasma, arcs, or sparks. When these excited atoms return to lower energy states, they emit light at specific wavelengths characteristic of each element. The resulting atomic emission spectrum, which consists of...
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