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单光子雪崩二极管电子接口的设计

Salvatore A Pullano^1,2, Giuseppe Oliva¹, Twisha Titirsha²

¹Department of Health Sciences, "Magna Graecia" University, 88100 Catanzaro, Italy.

Sensors (Basel, Switzerland)

|September 14, 2024

概括

这项研究引入了一个电子接口,以减少单光子雪崩二极管 (SPAD) 的死亡时间. 这种新的设计显著提高了用于高频应用的光子检测效率.

科学领域:

光子学和光电学和光电子学.
半导体设备半导体设备

背景情况:

单光子雪崩二极管 (SPAD) 对于检测单个光子至关重要,但在每个检测事件后被死亡时间限制.
这种死亡时间限制了它们在高频应用中的效率.
现有的SPAD设计面临着黑暗电流,光子检测概率和功耗消耗等挑战.

研究的目的:

研究一种电子接口,以减少SPAD的死亡时间.
提高SPAD在高频场景中的光子检测效率.
分析电子设计对SPAD性能的影响.

主要方法:

开发了一个电子接口,利用极点零补偿来最大限度地减少SPAD死亡时间.
设计和制造了一个纳米秒脉冲发生器用于测试.
多种补偿电容,观察其对火和恢复时间的影响.

主要成果:

火时间常数 (τq) 在很大程度上不受补偿电容的影响,但由于操作放大器 (op-amp) 增加了30%.
通过调整补偿电容,恢复时间显著减少,从927.3 ns降至9.8 ns.
使用SPAD和电子接口的实验结果与理论预测密切匹配.

结论:

开发的电子接口有效地减少了SPAD死亡时间,特别是恢复时间.
极零补偿是一种可行的技术,用于提高高频应用中的SPAD性能.
接口显示了提高单光子检测系统的整体效率的希望.

关键词:

雪崩晶体管是一个雪崩.灭电路的灭电路一个光子雪崩二极管 (SPAD)一个光子计时分辨率的分辨率.

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