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Updated: Apr 13, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

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使用扫描探头显微镜在自组装CO2岛上的结构和缺陷识别2

Oscar Custance1, Emiliano Ventura-Macias2, Oleksandr Stetsovych3

  • 1National Institute for Materials Science (NIMS), 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047, Japan.

ACS nano
|September 17, 2024
PubMed
概括

研究人员使用先进的显微镜和模拟在黄金表面上研究二氧化碳 (CO2). 他们发现了独特的二氧化碳结构,包括形安排,这对于开发二氧化碳捕获材料至关重要.

关键词:
1,4-烯二异化 1,4-烯二异化二氧化碳岛屿的二氧化碳.原子力显微镜的原子力显微镜.奇拉性是一种精神性.密度函数理论密度函数理论金属有机链条金属有机链条扫描道显微镜扫描道显微镜

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Microscopic Visualization of Porous Nanographenes Synthesized through a Combination of Solution and On-Surface Chemistry08:18

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