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强大的定量X射线相位诊断用于碳复合材料的表征在闪电诱导风险的背景下

Laureen Guitard^1,2, Adrien Stolidi¹, Georges Giakoumakis^1,2

¹Université Paris-Saclay, CEA, List, F-91120, Palaiseau, France.

Scientific reports

|September 18, 2024

概括

基于格的X射线相对照成像 (XPCI) 为材料分析提供了强大的相位测量,即使在损坏的复合材料中也是如此. 该技术通过分析相位和衰减数据来识别缺陷,揭示高达40%的密度变化.

科学领域:

材料科学材料科学材料科学
物理物理学物理
工程工程师工程师工程师

背景情况:

射线相对照成像 (XPCI) 方法可以从单个图像采集中解衰减,相位和散射信息,这对于材料分析非常有价值.
阶段和散射提取过程中的文物阻碍了XPCI的社会应用.
复杂的材料,如受损的复合材料,对精确的相位测量构成挑战.

研究的目的:

为了证明基于格子的XPCI在复杂材料中相位测量的稳定性.
开发一种自我评估方法,用于XPCI中的文物识别和信号解释.
使用XPCI. 调查碳纤维增强聚合物的闪电冲击引起的缺陷.

主要方法:

使用基于格子的X射线相对照成像 (XPCI) 来获取数据.
开发并应用了一种自我评估方法来识别和减轻成像工件.
分析了组合相位和衰减信息,以描述受到闪电袭击的碳纤维增强聚合物的缺陷.

主要成果:

基于格子的XPCI在损坏的复合材料中提供了强大的相位测量.
自我评估方法有效地识别了成像工件,使可靠的信号解释成为可能.
结合相位和衰减数据成功识别了闪电电流引起的缺陷,揭示了碳纤维增强聚合物的密度损失高达40%.
阶段信息被转换为相对质量密度变化,与X射线减弱对比断层扫描进行验证.

结论:

基于格子的XPCI是一种强大的技术,用于分析复杂的材料,即使是那些有损坏的材料.
开发的自我评估方法提高了XPCI在社会使用中的可靠性和适用性.
结合衰减对比度,XPCI有效地表征材料缺陷和密度变化,在闪电袭击等事件发生后,提供对材料完整性的宝贵见解.

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