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Ryun-Han Koo1, Wonjun Shin1,2,3, Jangsaeng Kim1,2

  • 1Department of Electrical and Computer Engineering and Inter-university Semiconductor Research Center, Seoul National University, Seoul, 08826, Republic of Korea.

概括

一种新的极化修剪方法通过消除弱极化域来提高铁电 (FE) 记忆的可靠性. 这提高了设备的性能,保留,并减少了先进电子和神经形态系统的噪音.