Jove
Visualize
联系我们

相关概念视频

Rapidly Varying Flow01:24

Rapidly Varying Flow

731
Rapidly varying flow (RVF) in open channels is characterized by abrupt changes in flow depth over a short distance, with the rate of depth change relative to distance often approaching unity. These flows are inherently complex due to their transient and multi-dimensional nature, making exact analysis difficult. However, approximate solutions using simplified models provide valuable insights into their behavior.Key Features of Rapidly Varying FlowRVF is commonly observed in scenarios involving...
731

您也可能阅读

相关文章

通过共同作者、期刊和引用图与本文相关的文章。

排序
Same author

Study of the Bias of the Initial Phase Estimation of a Sinewave of Known Frequency in the Presence of Phase Noise.

Sensors (Basel, Switzerland)·2024
Same author

Classification of Corrosion Severity in SPCC Steels Using Eddy Current Testing and Supervised Machine Learning Models.

Sensors (Basel, Switzerland)·2024
Same author

Investigation of Different Features for Baseline-Free RAPID Damage-Imaging Algorithm Using Guided Waves Applied to Metallic and Composite Plates.

Materials (Basel, Switzerland)·2023
Same author

Baseline-Free Damage Imaging of Composite Lap Joint via Parallel Array of Piezoelectric Sensors.

Sensors (Basel, Switzerland)·2023
Same author

Locating and Imaging Fiber Breaks in CFRP Using Guided Wave Tomography and Eddy Current Testing.

Sensors (Basel, Switzerland)·2022
Same author

Machine Learning Photovoltaic String Analyzer.

Entropy (Basel, Switzerland)·2020
JoVE
x logofacebook logolinkedin logoyoutube logo
关于 JoVE
概览领导团队博客JoVE 帮助中心
作者
出版流程编辑委员会范围与政策同行评审常见问题投稿
图书馆员
用户评价订阅访问资源图书馆顾问委员会常见问题
研究
JoVE JournalMethods CollectionsJoVE Encyclopedia of Experiments存档
教育
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab Manual教师资源中心教师网站
使用条款与条件
隐私政策
政策

相关实验视频

Updated: May 1, 2026

Emission Spectroscopic Boundary Layer Investigation during Ablative Material Testing in Plasmatron
09:41

Emission Spectroscopic Boundary Layer Investigation during Ablative Material Testing in Plasmatron

Published on: June 9, 2016

12.3K

在CFRP中使用侵蚀和值方法的基于流的分层成像.

Dario J Pasadas1, Mohsen Barzegar1, Artur L Ribeiro1

  • 1Instituto de Telecomunicações, Instituto Superior Técnico, Universidade de Lisboa, 1049-001 Lisbon, Portugal.

Sensors (Basel, Switzerland)
|September 28, 2024
PubMed
概括

使用先进的信号和图像处理进行流测试 (ECT),有效地描述了碳纤维增强塑料 (CFRP) 板中的分层. 该方法准确地识别出缺陷大小,这对于确保CFRP组件的结构完整性至关重要.

科学领域:

  • 材料科学 材料科学 材料科学
  • 非破坏性测试 不破坏性测试
  • 复合材料 复合材料 复合材料

背景情况:

  • 碳纤维增强塑料 (CFRP) 由于其优越的机械性能,对结构应用至关重要.
  • 损坏,包括分层,可以损害CFRP的完整性,需要强大的评估方法.
  • 非破坏性评估 (NDE) 技术对于评估CFRP结构的健康状况至关重要.

研究的目的:

  • 开发和评估信号和图像处理方法,用于在薄型CFRP板中使用Eddy Current Testing (ECT) 进行分层表征.
  • 调查峰值振幅和相位转移作为ECT中损伤敏感特征的有效性.
  • 量化评估损坏成像算法的性能,包括值和侵蚀方法,用于缺陷大小.

主要方法:

  • 采用了一种具有三个线圈元件的感应性ECT探头,用于两种配置的流感应.
  • 诱导电压的测量峰值振幅和激发和接收器信号之间的相位转移.
  • 执行C-扫描和应用图像处理技术,包括侵蚀和各种值方法,用于损坏成像.
  • 进行历史图分析,以比较数量评估值之前和之后的结果.

主要成果:

  • ECT成功生成了C扫描,揭示了CFRP板的分层缺陷.
关键词:
在CFRP的基础上.损伤成像 损伤成像脱层是分层的方法之一.厄迪电流测试 厄迪电流测试非破坏性评价 - - 非破坏性评价.

更多相关视频

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

13.8K
Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes
06:56

Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes

Published on: May 23, 2017

12.2K

相关实验视频

Last Updated: May 1, 2026

Emission Spectroscopic Boundary Layer Investigation during Ablative Material Testing in Plasmatron
09:41

Emission Spectroscopic Boundary Layer Investigation during Ablative Material Testing in Plasmatron

Published on: June 9, 2016

12.3K
Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

13.8K
Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes
06:56

Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes

Published on: May 23, 2017

12.2K
  • 信号特征 (峰值振幅,相位转移) 有效地表明了分层的存在.
  • 图像处理,特别是侵蚀和值,提高了缺陷尺寸提取的准确性.
  • 定量分析表明,能够评估不同分层尺寸的损伤.

    • 结论:

    • 应用于ECT数据的信号和图像处理方法在CFRP中提供了有效的分层表征.
    • 开发的损坏成像方法可以对缺陷的大小和形状进行定量评估.
    • 这种技术对于在关键应用中确保CFRP组件的结构完整性和安全性是有价值的.