2D使

Zhujun Huang1, Ryong-Gyu Lee2, Edoardo Cuniberto1

  • 1Electrical and Computer Engineering, New York University, Brooklyn, New York 11201, United States.

ACS nano
|September 28, 2024
PubMed
概括

鉴定单晶六角化 (hBN) 的缺陷对于先进的电子技术至关重要. 低频噪声光谱识别了hBN中的替代碳缺陷,使缺陷工程能够提高设备性能.

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