用于X射线成像水晶光谱仪在位波长校准的X射线源
K Shah1, L Delgado-Aparicio1, B F Kraus1
1Princeton Plasma Physics Laboratory, Princeton, New Jersey 08543, USA.
The Review of scientific instruments
|September 30, 2024
概括
精确的等离子流速测量需要在现场校准X射线成像水晶光谱仪 (XICS). 这项研究开发了X射线源来监测晶体中的温度变化,防止对多普勒变化的误解.
科学领域:
- 等离子体物理学的物理学
- 射线光谱 X射线光谱
- 材料科学 材料科学 材料科学
背景情况:
- 射线成像水晶光谱仪 (XICS) 对于融合装置中的等离子体诊断至关重要.
- 晶体温度的变化会导致光谱线的变化,模仿多普勒变化,导致不准确的等离子体流速测量.
- 在现场校准对于纠正这些由温度引起的变化至关重要.
研究的目的:
- 开发和评估X光源,用于XICS的现场校准.
- 测量X射线光谱线的温度依赖的变化.
- 为了确定晶格格子常数的热膨胀,以准确的波长校准.
主要方法:
- 实验室使用铜 (Cu) 射线源,加热的石英 (102) 晶体和皮拉图斯探测器进行实验.
- 测量Cu Kα1和Kα2的直线偏移是结晶温度的函数.
- 对布拉格反射平面与温度的二维格子常数的评估.
主要成果:
- 对Cu Kα1和Kα2X射线的量化温度依赖转移.
- 确定了晶体温度与2D网格常数之间的关系.
- 验证了使用X射线源在现场校准XICS的可行性.
结论:
- 发达的X射线源对于在核聚变装置中XICS的准确现场校准至关重要.
- 考虑到温度依赖的变化对于避免等离子体流速测量的错误至关重要.
- 开发的方法提供了在动态实验环境中精确波长校准的途径.
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