从量化阶段和振幅响应来确定铁电中的印记效应
Subhajit Pal1, Emanuele Palladino1, Haozhen Yuan1
1School of Engineering & Materials Science, Queen Mary University of London, London E1 4NS, United Kingdom.
概括
这项研究提出了一种新方法,使用压响应力显微镜 (PFM) 准确测量铁电性质. 通过结合切换光谱-PFM和凯尔文探针力显微镜,可以获得无工件的电力学数据,以获得可靠的纳米尺度表征.
科学领域:
- 材料科学 材料科学 材料科学
- 纳米技术 纳米技术
- 物理 物理学 物理
背景情况:
- 焦响应力显微镜 (PFM) 对于纳米级铁电性质表征至关重要.
- 由于静电相互作用,PFM信号可能被误解.
- 精确的校准和人工物清除对于可靠的PFM测量至关重要.
研究的目的:
- 为PFM测量开发一种无工件的方法.
- 为了准确量化铁电材料的印记电压.
- 为了证明SS-PFM和KPFM的联合使用,以进行增强的纳米分析.
主要方法:
- 关于PFM的详细校准过程.
- 识别和纠正寄生性相位偏移的程序.
- 结合切换光谱-PFM (SS-PFM) 和凯尔文探针力显微镜 (KPFM) 的方法.
- 数据立方体-PFM技术用于2D映射.
主要成果:
- 通过结合SS-PFM和KPFM获得的无人工物相振幅环.
- 在基于BaTiO3和BiFeO3的材料中精确量化印记电压.
- 展示选择正确的读取电压的关键作用.
- 在BaTiO3单晶域中生成2D打印电压图.
结论:
- 开发的方法使得无工件的PFM测量能够进行精确的电机性能量化.
- 结合SS-PFM和KPFM的方法提供了可靠的纳米级特征铁电材料.
- 准确的PFM分析对于理解和设计铁电设备至关重要.
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