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了解AFM-IR信号依赖样品厚度和激光激发:实验和理论见解

Devon S Jakob¹, Jeffrey J Schwartz^1,2,3, Georges Pavlidis^1,4

¹Nanoscale Devices Characterization Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States.

Analytical chemistry

|October 4, 2024

概括

光热诱导共振 (PTIR) 通过将样本厚度与信号强度联系起来来增强纳米级的IR光谱学. 了解这种关系对于准确的材料识别和纳米尺度的定量分析至关重要.

科学领域:

频谱学是一种光谱学.
材料科学材料科学材料科学
纳米技术纳米技术

背景情况:

光热诱导共振 (PTIR),或原子力显微镜-红外 (AFM-IR),提供纳米级的红外吸收光谱.
PTIR能够在纳米尺度上进行材料识别和成分分析,即使在深度超过1微米.

研究的目的:

为了研究PTIR信号强度与样本厚度的依赖性.
了解激光参数 (重复率,脉冲长度) 对PTIR测量的影响.
开发一个PTIR信号传导模型并通过实验验证它.

主要方法:

在不同厚度 (高达2.5微米) 的3D打印形结构上测量PTIR光谱.
在测量过程中,IR激光重复率和脉冲长度的系统变化.
开发一个理论模型,将样本热膨胀动态与悬臂激发幅度相关联起来.

主要成果:

随着样本厚度,PTIR信号强度单调地增加.
较高的激光重复率导致灵敏度下降,而脉冲长度的影响最小.
观察到高达~500nm的厚度的近似信号线性,表明适合用于具有低地形变异的定量分析.
在显著深度的各种吸收模式中实现了不扭曲的吸收PTIR光谱.

结论:

建立了定量纳米级PTIR分析和材料识别的基础见解.
证明了样品厚度和激光参数在PTIR测量中的关键作用.
突出了PTIR在各种应用中用于先进材料表征的潜力.

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