Search research articles

关于 JoVE

概览领导团队博客 JoVE 帮助中心

作者

出版流程编辑委员会范围与政策同行评审常见问题投稿

图书馆员

用户评价订阅访问资源图书馆顾问委员会常见问题

研究

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments 存档

教育

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual 教师资源中心教师网站

使用条款与条件

相关概念视频

Electron Microscope Tomography and Single-particle Reconstruction

Electron Microscope Tomography and Single-particle Reconstruction

Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...

您也可能阅读

相关文章

通过共同作者、期刊和引用图与本文相关的文章。

排序

Same author

Low loss poly-silicon for high performance capacitive silicon modulators.

Optics express·2018

Same author

Doping porous silicon with erbium: pores filling as a method to limit the Er-clustering effects and increasing its light emission.

Scientific reports·2017

Same author

Toward an accurate quantification in atom probe tomography reconstruction by correlative electron tomography approach on nanoporous materials.

Ultramicroscopy·2017

Same author

Non-rigid alignment in electron tomography in materials science.

Journal of microscopy·2016

Same author

Combining Accurate O2 and Li2O2 Assays to Separate Discharge and Charge Stability Limitations in Nonaqueous Li-O2 Batteries.

The journal of physical chemistry letters·2015

Same author

Self-adapting denoising, alignment and reconstruction in electron tomography in materials science.

Ultramicroscopy·2015

Search research articles

相关实验视频

Updated: Jun 11, 2025

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

在微电子领域的TEM-ASTAR分析中,应用一种新的局部和自动PCA算法来进行衍射图案无色化.

Tony Printemps¹, Karen Dabertrand¹, Jérémy Vives¹

¹STMicroelectronics, Crolles, France.

Ultramicroscopy

|October 6, 2024

概括

这项研究介绍了LAT-PCA,这是一种新的方法,用于拒绝传输电子显微镜 - 原子探头断层扫描 (TEM-APT) 衍射模式数据集. 它大大减少了噪音和分析时间,以准确的结晶学粒状特征.

关键词:

这就是ACOM-TEM.阿斯塔尔 (ASTAR) 是一个星球.拒绝这种行为,就是拒绝.衍射模式的衍射模式马尔琴科-帕斯图尔是什么意思在PCA中,PCA是PCA.

更多相关视频

Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles

Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles

Published on: July 5, 2016

Picometer-Precision Atomic Position Tracking through Electron Microscopy

Picometer-Precision Atomic Position Tracking through Electron Microscopy

Published on: July 3, 2021

相关实验视频

Last Updated: Jun 11, 2025

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles

Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles

Published on: July 5, 2016

Picometer-Precision Atomic Position Tracking through Electron Microscopy

Picometer-Precision Atomic Position Tracking through Electron Microscopy

Published on: July 3, 2021

科学领域:

材料科学材料科学材料科学
晶体学晶体学是指结晶学.
数据分析数据分析

背景情况:

传输电子显微镜 - 原子探头断层扫描 (TEM-APT) 生成4D衍射模式 (DP) 数据集.
在DP数据集中的噪声使准确的晶体分析和定量粒度表征变得复杂.
现有的无色化方法可能缺乏效率或适应局部晶体信号的适应性.

研究的目的:

为TEM-APT DP数据集引入一种新的拒绝方法,LAT-PCA (本地自动值 - 主要组件分析).
通过减少DP数据中的噪声来提高晶体分析的效率和准确性.
减少用于TEM-APT分析的数据采集和后处理时间.

主要方法:

在4D DP数据集的本地化窗口上实施主要组件分析 (PCA).
使用Marchenko-Pastur分布器来自动限制主要组件中的噪声门.
专注于含有物理晶体信号的更高阶主要组件.

主要成果:

LAT-PCA有效地降低了噪音,同时保留了基本的DP特性.
该方法显著减少了采集和后处理时间.
剥离的数据有助于更直接,更准确的相位映射和粒度定向的确定.
在 - - 碳样本上的实验验验证了该方法的可靠性和比较低信号-噪声数据的改进.

结论:

LAT-PCA是一种有效的,自动的解决方案,用于消除TEM-APT DP数据集的噪音.
局部处理和自动值提高了计算效率和适应不同噪音水平的适应性.
这种方法提高了数据集质量,减少了分析时间,并将文物最小化,从而导致更准确的材料表征.