化无形的移动性差距与的度及其对电性能的影响有关
Francesca Peverini1,2, Saba Aziz3, Aishah Bashiri3,4
1Istituto Nazionale di Fisica Nucleare (INFN), Sez. di Perugia, Via Pascoli s.n.c., 06123 Perugia, Italy.
Nanomaterials (Basel, Switzerland)
|October 15, 2024
概括
化无形 (a-Si) 探测器在辐射检测方面表现有前途. 性能因基质而异,基于卡普顿的探测器的灵敏度低于晶探测器.
科学领域:
- 材料科学 材料科学 材料科学
- 半导体物理 半导体物理
- 探测器技术 探测器技术
背景情况:
- 化无形 (a-Si) 是一个有前途的材料,用于辐射检测,因为它的调节性质.
- 化可显著降低a-Si的缺陷密度,使其适用于设备应用.
- 了解结构-属性关系对于优化a-Si探测器性能至关重要.
研究的目的:
- 研究不同基板对化无形 (a-Si) 辐射探测器性能的影响.
- 为了比较在晶 (c-Si) 和柔性卡普顿基板上制造的a-Si探测器.
- 阐明导致不同基板上的探测器之间性能差异的因素.
主要方法:
- 电气特性 (噪音,泄漏电流).
- 光谱技术:拉曼光谱,光辐射和反光辐射.
- 对探测器灵敏度,噪声和泄漏电流进行比较分析.
主要成果:
- 在卡普顿沉积的a-Si探测器显示灵敏度降低,与c-Si.
- 在两个基板上的探测器之间,噪音和泄漏电流水平是可比的.
- 基板材料,膜形态和能量水平对齐是导致灵敏度差异的假设原因.
结论:
- 基板的选择显著影响化无形 (a-Si) 辐射探测器的性能.
- 卡普顿基板可能导致探测器灵敏度降低,这需要进一步调查潜在机制.
- 未来的研究将专注于验证关于基质对a-Si探测器性能影响的假设.
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