个别域的特征是通过第二波代衍光仪确定的,用于多域的多铁体

Young Jin Jeong1, Do Gyeom Jeong1, Hwiin Ju1

  • 1Department of Physics and Photon Science, Gwangju Institute of Science and Technology (GIST), Gwangju, 61005, Republic of Korea.

Scientific reports
|October 16, 2024
PubMed
概括

我们开发了SHG衍光测量技术来分析多铁La-doped BiFeO3薄膜. 这种方法揭示了多域铁性材料中的电极化细节.