X线

Juan F P Mosquera1, Giovanni Cistaro1, Mikhail Malakhov1,2

  • 1Departamento de Química, Universidad Autónoma de Madrid, 28049 Madrid, Spain.

概括

这项研究表明,X射线吸收光谱如何检测切尔恩绝缘体中的拓相变. 超快激光脉冲揭示了与材料的果结构相关的签名.

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