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Updated: Jun 10, 2025

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station

Published on: April 1, 2020

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使用下一代光向量频谱分析仪对波导进行直接相位测量

Andrew Grieco1

  • 1Qualcomm Institute, University of California San Diego, 9500 Gilman Dr, La Jolla, CA, 92093, USA. agrieco@ucsd.edu.

Light, science & applications
|October 18, 2024
PubMed
概括

一个新的双模式光学矢量频谱分析仪可以描述被动设备和主动激光源. 这种多功能仪器高精度地测量了宽带宽的损失,相应反应和分散.

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Fabrication And Characterization Of Photonic Crystal Slow Light Waveguides And Cavities

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Using Microwave and Macroscopic Samples of Dielectric Solids to Study the Photonic Properties of Disordered Photonic Bandgap Materials10:35

Using Microwave and Macroscopic Samples of Dielectric Solids to Study the Photonic Properties of Disordered Photonic Bandgap Materials

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相关概念视频

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation01:26

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
There are three main types of inductively coupled plasma atomic emission spectroscopy  (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used....
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