关于使用反射极化光学显微镜快速比较P3HT的晶度和相分离:PCBM薄膜

Rawan A Alzahrani1, Nisreen Alshehri1,2, Alaa A Alessa1

  • 1Physical Sciences and Engineering Division (PSE), KAUST Solar Center (KSC), King Abdullah University of Science and Technology (KAUST), Thuwal, 23955-6900, Kingdom of Saudi Arabia.

概括

反射偏光光学显微镜 (POM) 快速评估聚合物:富勒烯混合薄膜. 该技术有效地测量晶度和相分离,这对于自动化光电子设备制造至关重要.