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数据驱动的指纹纳米电子机械质谱法

John E Sader1,2, Alfredo Gomez3,4, Adam P Neumann3

  • 1Graduate Aerospace Laboratories, California Institute of Technology, Pasadena, California, 91125, USA. jsader@caltech.edu.

Nature communications
|October 22, 2024
PubMed
概括

纳米电子机械系统质谱学 (NEMS-MS) 的新数据驱动指纹检测方法允许在没有先前设备知识的情况下进行准确的质量测量. 这种方法可以使用复杂的NEMS设备进行增强的粒子和分子分析.

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