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Updated: Jun 9, 2025

A Guide to Structured Illumination TIRF Microscopy at High Speed with Multiple Colors
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A Guide to Structured Illumination TIRF Microscopy at High Speed with Multiple Colors

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快速选择性边缘增强成像,具有拓性的性状层状上层结构

Wen Chen1, Dong Zhu1, Si-Jia Liu1

  • 1National Laboratory of Solid State Microstructures, Key Laboratory of Intelligent Optical Sensing and Manipulation, College of Engineering and Applied Sciences, and Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing 210093, China.

National science review
|October 23, 2024
PubMed
概括

这项研究引入了一种全新的全光边缘检测方法,使用可切换的铁电液晶拓结构. 它实现了对象边缘的超快,选择性增强,为光学计算应用铺平了道路.

关键词:
边缘检测 边缘检测 边缘检测快速响应的快速反应铁电液晶晶体的电铁电液晶体的电铁电液晶体的电铁电液晶体的电铁电液晶体的电铁电.拓结构是一个拓结构.矢量光束是指一个矢量光束.

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