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添加的伊矿矿闪器作为绝对超冷中子探测器

M Krivoš¹, N C Floyd^1,2, Z Tang¹

¹Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USA.

The Review of scientific instruments

|October 25, 2024

概括

在UCNProBe实验将测量中子寿命使用一个新的伊矿矿 (YAP:Ce) 闪电器. 这种新型探测器显示了对中子捕获的高效率和改进的超冷中子 (UCN) 计数,这对于精确的生命周期测量至关重要.

科学领域:

核物理核物理核物理
粒子物理学的粒子物理学.
探测器技术探测器技术

背景情况:

精确的中子寿命测量对于基础物理学和宇宙学至关重要.
之前的实验面临着系统不确定性的局限性.
UCNProBe实验旨在通过使用不同的方法来提高精度.

研究的目的:

为了测试和表征一种新的10B涂层的中子检测中矿 (YAP:Ce) 闪器.
为了评估与超冷中子 (UCN) 测量相关的闪器的性能.
在UCNProBe实验的背景下评估YAP:Ce闪器的性能.

主要方法:

YAP的特征:Ce闪器特性,包括伯克斯系数.
测量由于10B涂层和通过其他闪光灯传输的光损耗.
在10B涂层上确定中子捕获效率.
对YAP:Ce和标准ZnS:Ag屏幕之间的UCN计数效率进行比较.

主要成果:

在YAP:Ce闪器显示的伯克斯系数为 (5.56-0.30+0.05) ×10-4厘米/MeV.
显著的光损失 (大约. 由于10B涂层,观察到的60%) 是10B涂层.
测量10B涂层的中子捕获效率为 (86.8 ± 2.6) %.
与ZnS:Ag屏幕相比,YAP:Ce晶体的UCN数量比ZnS:Ag屏幕高8%-28%.

结论:

经过测试的YAP:Ce闪电器具有有利的特性,如高费米电位和快速衰变时间,有利于UCN实验.
闪电器显示出有希望的中子捕获效率和改进的UCN检测能力.
对UCN计数中观察到的差异进行进一步调查可能是有必要的,可能与涂层均性有关.

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