在双显微镜中,共聚焦振幅图像和共聚焦相位图像之间的连贯连接
Takahiko Mizuno1, Takuya Tsuda2, Eiji Hase1
1Institute of Post-LED Photonics (pLED), Tokushima University, 2-1 Minami-Josanjima, Tokushima, Tokushima, 770-8506, Japan.
Scientific reports
|October 28, 2024
概括
我们介绍了一种双显微镜 (DCM) 方法,将振幅和相位图像集成在一起. 这种技术解决了相位模糊性,使高分辨率成像能够在广泛的轴距范围内进行各种应用.
科学领域:
- 光学显微镜的使用方法
- 计量学 计量学 计量学
- 影像科学 影像科学
背景情况:
- 双显微镜 (DCM) 融合了共聚焦激光显微镜和定量相位显微镜.
- DCM提供高轴分辨率和无扫描成像功能.
- 阶段封装在定量阶段测量中引入了模两可.
研究的目的:
- 开发一种方法来整合DCM的对焦振幅和相位图像.
- 通过利用图像连贯性来消除相环绕的模两可.
- 为了增强DCM成像的轴动态范围.
主要方法:
- 在一个单一的DCM系统中集成对焦振幅和相位数据.
- 利用振幅和相位图像之间的连贯性来确定相位包裹代.
- 在微米光学厚度和纳米表面粗度的样本上演示该方法.
主要成果:
- 成功地消除了相封装中的模糊性.
- 实现了从微米到毫米的扩大轴向成像范围.
- 保持了纳米级的轴分辨率.
- 能够同时获取对焦振幅和绝对相位图像.
结论:
- 集成的DCM成像技术增强了轴动态范围,同时保持了高分辨率.
- 这种方法扩大了DCM在需要精确3D计量学的领域的适用性.
- 在DCM中同时振幅和相位成像为先进的成像应用提供了显著的优势.
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