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Updated: Jul 12, 2026

In Depth Analyses of LEDs by a Combination of X-ray Computed Tomography CT and Light Microscopy LM Correlated with Scanning Electron Microscopy SEM
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In Depth Analyses of LEDs by a Combination of X-ray Computed Tomography CT and Light Microscopy LM Correlated with Scanning Electron Microscopy SEM

Published on: June 16, 2016

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基于剩余全球上下文机制的车辆迷你LED背光显示器检查

Guobao Zhao1, Xi Zheng1, Xiao Huang1

  • 1Department of Electronic Science, Xiamen University, Xiamen, 361000, China.

Frontiers of optoelectronics
|October 29, 2024
PubMed
概括

一个新的深度学习模型通过准确检测死像素和精确的LED放置来增强Mini-LED背光质量控制. 这种先进的方法提高了高性能液晶显示器生产线的效率.

关键词:
自动光学检查自动化检查深度学习是一种深度学习.显示显示器 显示器迷你LED是一个迷你LED.

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相关概念视频

Biasing of P-N Junction01:16

Biasing of P-N Junction

The operation of a p-n junction diode involves various biasing conditions, including forward bias, reverse bias, and equilibrium.
In equilibrium, no external voltage is applied across the p-n junction. The depletion region is formed at the junction interface due to the diffusion of carriers, which leaves behind charged dopants, acceptors on the p-side, and donors on the n-side. These immobile charges create an electric field that prevents further diffusion of carriers. The related energy band...