相对的X射线微纳米图与扫描电子显微镜在先进的光源
Arun J Bhattacharjee1, Harrison P Lisabeth1, Dilworth Parkinson2
1Energy Geosciences Division, Lawrence Berkeley National Laboratory, 1 Cyclotron Rd, Berkeley, CA 94720, USA.
Journal of synchrotron radiation
|October 29, 2024
概括
这项研究引入了一种多尺度成像方法,将X射线断层扫描和SEM-EDS用于地质样本. 它揭示了复杂的3D微观结构,并强调了为准确的岩石表征而进行多尺度分析的必要性.
科学领域:
- 地质科学 地质科学
- 材料科学 材料科学 材料科学
- 分析化学 分析化学
背景情况:
- 地质样本在多个尺度上表现出属性,需要纳米尺度的表征才能完全理解.
- 射线断层扫描提供3D微观结构信息,但缺乏化学细节.
- 扫描电子显微镜与能量分散光谱 (SEM-EDS) 提供化学分析,但通常以较低的分辨率或2D.
研究的目的:
- 开发和验证用于测量多尺度3D微观结构和地质样本中的化学物质的相关方法.
- 整合X射线微和纳米图形与SEM-EDS进行全面的样本表征.
- 在蛇形岩石和玄武岩石样本上演示本协议的应用.
主要方法:
- 在岩石核心上进行微型X射线断层扫描.
- 采用激光削用于纳米图形学子样本的准备.
- 进行纳米图谱,然后在准备好的样本上进行SEM-EDS成像和组成映射.
主要成果:
- 揭示了蛇形和玄武岩中的多尺度3D结构,包括矿物阶段和毛孔网络.
- 根据成像分辨率观察到孔隙和矿物相体积分数的显著变化.
- 利用SEM-EDS化学映射来帮助X射线成像中的低对比度细分阶段.
结论:
- 相关的多尺度方法对于准确地描述像岩石这样的复杂地质聚合物至关重要.
- 综合方法提供了互补的微观结构和化学信息.
- 该协议广泛适用于用户设施的3D成像研究.
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