测试低光束能量电子激发X射线微分析的精度,使用能量分散光谱学
Dale E Newbury1, Nicholas W M Ritchie1
1National Institute of Standards and Technology, Gaithersburg, MD 20899-8370 USA.
概括
使用5keV的能量分散光谱法 (EDS) 实现了电子激发X射线微分析的高精度. 对于39个元素,超过98%的元素分析结果在±5%的相对偏差范围内,其中82%在±2%内.
科学领域:
- 材料科学 材料科学 材料科学
- 分析化学 分析化学
- 物理 物理学 物理
背景情况:
- 激发电子的X射线微分析对于元素组成的确定至关重要.
- 能量分散光谱法 (EDS) 是这种分析的常见技术.
- 低光能为精确的元素量化带来了挑战.
研究的目的:
- 为了评估 EDS 微分析在 5 keV 的低落光束能量时的准确性.
- 评估各种元素和材料类型的性能.
- 为了验证k-ratio协议和NIST DTSA-II软件的可靠性.
主要方法:
- 使用电子激发X射线微分析与EDS.
- 分析了113种经过认证的参考材料,石化化合物,矿物和金属合金.
- 对39个元素进行了263次度测量.
- 使用k-ratio协议和NIST DTSA-II软件进行分析.
主要成果:
- 超过98%的元素分析结果与预期值相对偏差为±5%.
- 显著的82%的结果实现了高精度,在-2%至2%的相对偏差范围内.
- 该方法对周期表中的元素 (不包括H和He) 显示出了极好的准确性.
结论:
- 用5keV的EDS进行电子激发X射线微分析,可提供高度准确的元素定量.
- k-ratio协议和NIST DTSA-II软件是低光束能量微分析的可靠工具.
- 这种技术适用于在近束能量下对各种材料进行精确的元素分析.
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