使

Jinyoung Hwang1, Jungmin Lee1, Seung Taek Jo2

  • 1School of Electronics and Information Engineering, Korea Aerospace University, Goyang-si, Gyeonggi-do 10540, Republic of Korea. jinhwang@kau.ac.ck.

Nanoscale
|October 31, 2024
PubMed
概括

本研究提出了一个计算框架,可以使用图像分析准确测量金属纳米网中的电导率. 经过验证的方法精确量化了纳米材料的特性,有助于纳米结构的评估.

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Theory of Metallic Conduction01:17

Theory of Metallic Conduction

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Resistivity01:22

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