改进了Agfa X射线薄膜的特性,用于不透明光谱诊断

A E Peterson1, E C Dutra1, C S Conlon1

  • 1Nevada National Security Sites, Livermore Operations, Livermore, California 94550, USA.

概括

美国国家点火设施软X射线光谱成像的Agfa D4薄膜表征显示了更好的光谱分辨率. 更新的分析和同步辐射源减少了不确定性,提高了高能量密度实验诊断.

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