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Liheng Bian1, Xuyang Chang1, Hanwen Xu1

  • 1State Key Laboratory of CNS/ATM & MIIT Key Laboratory of Complex-field Intelligent Sensing, Beijing Institute of Technology, No 5 Zhongguancun South Street, Haidian District, 100081, Beijing, China.

PubMed
概括

事件检测技术大大加快了光场显微镜成像速度. 这种进步也提高了轴分辨率,即使在散射介质内.