在尘埃污染下对Sn-58Bi无合金进行电化学迁移研究
Fuye Lu1, Han Sun1, Wenlong Yang1
1School of Materials Science and Engineering, Dalian University of Technology, Dalian 116000, China.
Materials (Basel, Switzerland)
|November 9, 2024
概括
在NaCl中,Sn-58Bi可以比Na2SO4溶液更好地抵抗电化学迁移 (ECM). 像NaCl和Na2SO4这样的尘埃污染物加速了微型电子设备的ECM故障.
科学领域:
- 材料科学 材料科学 材料科学
- 电化学 电化学 电化学
- 可靠性工程可靠性工程
背景情况:
- 电子包装的小型化增加了由于高密度电场,水分和污染物的电化学迁移 (ECM) 的易感性.
- 空气污染引入灰尘,这是ECM的一个重要因素,含有NaCl和Na2SO4.4等可溶盐.
- 在尘埃引起的污染下,了解接接头的ECM故障机制对于可靠的电子设备至关重要.
研究的目的:
- 研究暴露于NaCl和Na2SO4溶液的Sn-58Bi接接头的电化学迁移失效机制,模拟尘埃中可溶盐.
- 为了比较Sn-58Bi在NaCl中的ECM电阻与Na2SO4溶液.
- 分析ECM过程中形成的树突的组成,并评估的耐腐蚀性.
主要方法:
- 使用水滴实验方法分析Sn-58Bi接接头的ECM故障.
- 使用0.2mM/L NaCl和Na2SO4溶液模拟可溶盐污染物.
- 采用X射线光电子光谱 (XPS) 来分析树组成和偏振测试以确定腐蚀潜力.
主要成果:
- 与Na2SO4 (32秒) 相比,Sn-58Bi在NaCl中表现出较长的平均故障时间 (53秒).
- 在XPS分析中,发现了主要由Sn,SnO和SnO2组成的树突,以及Sn(OH) 2和Na2SO4沉物.
- 极化测试显示,NaCl (-0.351 V) 的腐蚀潜力高于Na2SO4 (-0.360 V),表明NaCl的耐腐蚀性更好.
结论:
- 与Na2SO4溶液相比,Sn-58Bi在NaCl溶液中对电化学迁移具有更高的抵抗力.
- NaCl和Na2SO4之间的阳极溶解特性差异显著影响ECM故障时间.
- 粉尘中的可溶盐对电子包装的可靠性构成相当大的风险,其影响因盐的成分而异.
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