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Updated: Aug 11, 2026

In Depth Analyses of LEDs by a Combination of X-ray Computed Tomography CT and Light Microscopy LM Correlated with Scanning Electron Microscopy SEM
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In Depth Analyses of LEDs by a Combination of X-ray Computed Tomography CT and Light Microscopy LM Correlated with Scanning Electron Microscopy SEM

Published on: June 16, 2016

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基于FDTD的不同发射波长的深紫外线LED,微LED和纳米LED的数值模拟

Jiangxie Jia, YuanDong Ruan, Yuning Gu

    Optics express
    |November 14, 2024
    PubMed
    概括

    这项研究通过减少设备尺寸来提高纳米LED和微LED的深紫外线 (DUV) 光提取效率 (LEE). 较小的DUV设备显示出更高的LEE,减少分歧和更低的功耗,有利于光学无线通信等应用.

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    Electronic Distance Measuring Instruments01:30

    Electronic Distance Measuring Instruments

    Electronic Distance Measuring Instruments (EDMs) are essential tools in modern surveying, offering precise distance measurements by emitting electromagnetic signals and calculating the time required for these signals to travel to a target and return. Two primary types of signals are used in EDMs — light waves and microwaves — each suited to specific environmental and distance requirements. Light-wave-based EDMs utilize either infrared or laser light, providing high accuracy over short distances...