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Updated: Jun 7, 2025

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关于脉冲力凯尔文探针力显微镜中的仪器参数的教程

Guillermo Lozano-Onrubia1, Mikhail A Nazarov1, Gilbert C Walker1

  • 1Department of Chemistry, University of Toronto, Toronto, Ontario M5S 3H6, Canada.

Langmuir : the ACS journal of surfaces and colloids
|November 20, 2024
PubMed
概括

凯尔文探针力显微镜 (KPFM) 测量了先进电气设备的表面潜力. 本指南详细介绍了实验参数,以克服实施复杂性并改进接触电位差异测量.

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Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
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