薄膜的UV/Vis/NIR透射光谱的高级无色化方法
Optics express
|November 22, 2024
概括
一种新的方法,SMEDM,有效地否定UV/Vis/NIR传输光谱 (T(λ)) 使用完整的集体实证模式分解与自适应噪声 (CEEMDAN). 这种方法通过减少光谱数据中的噪声,显著提高了薄膜特征的准确性.
科学领域:
- 材料科学 材料科学 材料科学
- 光学物理学的光学物理学
- 频谱学是一种光谱学.
背景情况:
- 紫外线/Vis/NIR透射光谱 (T(λ)) 对于使用光谱光度计和光谱圆度计进行薄膜表征至关重要.
- 现有的剥光方法,如光滑,可能会限制片特征的准确性.
- 在T ((λ) 中的噪音源于测量设备和环境因素.
研究的目的:
- 为UV/Vis/NIR透射光谱引入和验证一种新的无声化方法SMEDM.
- 通过有效地从光谱数据中去除噪声来提高薄膜特征的准确性.
- 将SMEDM的性能与其他合适的除尘技术进行比较.
主要方法:
- 拟议的SMEDM方法使用来自CEEMDAN分解T的内在模式函数 (IMFs).
- SMEDM使用IMF的平滑中间包裹来识别和计算频谱内的噪声组件.
- 该方法在基板上的薄膜的八个合成和两个实验T(λ) 光谱上进行了测试.
主要成果:
- 在所有测试案例中,SMEDM在模型光谱方面取得了最准确的无色化结果.
- 该方法表明高幅度的准确性 (MACN>70%),即使对于低幅度的模型噪声.
- 对于分析的光谱来说,SMEDM被证明优于其他常用的无色化方法.
结论:
- 与CEEMDAN相结合的SMEDM提供了一种非常准确和有效的方法来消除UV/Vis/NIR传输频谱的噪声.
- 开发的方法显著提高了薄膜表征的可靠性.
- 对于研究人员来说,SMEDM是一个有价值的工具,用于处理光谱光度和圆度数据.
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