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Updated: Jun 19, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Published on: December 5, 2015

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薄型和厚型MoTe光探测器的比较分析:对下一代光电子产品的影响

Saddam Hussain1, Shaoguang Zhao1, Qiman Zhang1

  • 1Center for Quantum Physics, Key Laboratory of Advanced Optoelectronic Quantum Architecture and Measurement (MOE), School of Physics, and Center for Interdisciplinary Science of Optical Quantum and NEMS Integration, Beijing Institute of Technology, Beijing 100081, China.

Nanomaterials (Basel, Switzerland)
|November 26, 2024
PubMed
概括

二甲 (MoTe2) 光探测器的性能因厚度而异. 薄MoTe2在520nm处表现出色,而厚的MoTe2在1064nm处表现出色,指导了未来光电子设备的设计.

关键词:
这就是MoTe2Te2的原因.光电子性能表现的光电子性能表现摄影探测器是一种光检测器.响应性的响应性厚薄膜是一种厚薄膜.薄膜是一种薄膜.

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Close-Space Sublimation-Deposited Ultra-Thin CdSeTe/CdTe Solar Cells for Enhanced Short-Circuit Current Density and Photoluminescence12:21

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相关概念视频

Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.