相关实验视频

Updated: May 12, 2026

Fabrication of Gate-tunable Graphene Devices for Scanning Tunneling Microscopy Studies with Coulomb Impurities
11:42

Fabrication of Gate-tunable Graphene Devices for Scanning Tunneling Microscopy Studies with Coulomb Impurities

Published on: July 24, 2015

15.4K

量子痕在石墨烯中留下了自己的印记

Dmitry Abanin, Maksym Serbyn

    Nature
    |November 28, 2024
    PubMed
    概括

    No abstract available in PubMed .

    关键词:
    材料科学物理量子物理学

    更多相关视频

    Advanced Experimental Methods for Low-temperature Magnetotransport Measurement of Novel Materials10:36

    Advanced Experimental Methods for Low-temperature Magnetotransport Measurement of Novel Materials

    Published on: January 21, 2016

    10.5K
    Scalable Quantum Integrated Circuits on Superconducting Two-Dimensional Electron Gas Platform05:39

    Scalable Quantum Integrated Circuits on Superconducting Two-Dimensional Electron Gas Platform

    Published on: August 2, 2019

    9.5K

    相关概念视频

    Atomic Force Microscopy01:08

    Atomic Force Microscopy

    Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
    The AFM Probe
    The probe is regarded as the heart of any AFM setup and comprises the...