在聚合物基有机场效应晶体管中的运行稳定性的高估是由于接触电阻引起的
Kenji Sakamoto1, Takeshi Yasuda2, Takeo Minari1
1Research Center for Macromolecules and Biomaterials, National Institute for Materials Science (NIMS), 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan.
ACS applied materials & interfaces
|December 1, 2024
概括
接触电阻显著影响有机场效应晶体管 (OFET) 稳定性评估. 对接触电阻 (Rc) 的校正显示了真正的操作稳定性,特别是在短通道设备中,防止高估性能.
科学领域:
- 材料科学 材料科学 材料科学
- 电子 电子 电子 电子 电子 电子 电子
- 半导体 半导体 半导体
背景情况:
- 有机场效应晶体管 (OFET) 对于灵活的电子产品至关重要.
- 了解偏差压力效应对于OFET的运营稳定至关重要.
研究的目的:
- 调查接触电阻 (Rc) 对聚合物基OFET偏差应力效应的影响.
- 为了评估 OFET 运行稳定的通道长度依赖性.
主要方法:
- 制造各种通道长度 (50-500微米) 的底门,顶接触聚合物OFET.
- 重复的偏向应力应用和转移特征测量.
- 分析值电压 (Vth) 和移动性 (μ) 随着和没有Rc校正的移动.
主要成果:
- 在偏差压力下,OFETs表现出非线性转移特征和降解.
- 在没有Rc校正的情况下,观察到Vth转移和μ减小的明显通道长度依赖.
- 对Rc的校正消除了通道长度的依赖性,揭示了短通道设备的高估稳定性.
结论:
- 接触电阻显著影响OFET的表面运行稳定性.
- 在没有Rc校正的情况下,短通道OFET稳定性被高估了,特别是在高流动性设备中.
- 关注Rc对于准确的OFET研究和开发至关重要,特别是关于活性层和接口的研究和开发.
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