深度学习辅助可重新配置的超表面天线,用于实时全息光束转向

Total internal reflection fluorescence microscopy or TIRF is an advanced microscopic technique used to visualize fluorophores in samples close to a solid surface with a higher refractive index, such as a glass coverslip. TIRF only allows fluorophores in proximity to the solid surface to be excited. When light from a medium with a lower refractive index (such as air) hits the glass coverslip at a critical angle, the light undergoes total internal reflection stead of passing through the glass.

Super-resolution fluorescence microscopy (SRFM) provides a better resolution than conventional fluorescence microscopy by reducing the point spread function (PSF). PSF is the light intensity distribution from a point that causes it to appear blurred. Due to PSF, each fluorescing point appears bigger than its actual size, and it is the PSF interference of nearby fluorophores that causes the blurred image. Various approaches to achieving higher resolution through SRFM have recently been developed.

During leveling, the Earth's curvature and atmospheric refraction introduce deviations in the line of sight from a true horizontal reference. When the line of sight is leveled, it remains perpendicular to the plumb line only at a single point. Beyond this, it deviates due to the Earth’s curvature, represented by the correction C. For a sight distance D, the deviation can be derived using the relationship:This relationship shows that the deviation increases quadratically with distance. Over a...